Steve D Beyer


Mr. Beyer practices intellectual property law with a significant emphasis on emerging technologies and companies. His extensive experience includes: client counseling on intellectual property matters; expert opinions concerning patent matters; intellectual property audits and due diligence reviews; the preparation and prosecution of patent applications, and trademark matters. Representative technologies handled by Mr. Beyer include computer software, semiconductor technologies;,medical devices, networking technologies, mechanical equipment, and telecommunications.

Mr. Beyer began his career in the patent field as an examiner in the United States Patent and Trademark Office while he attended law school.

He is a member of the U.S. Patent Bar and a member of both the California and Colorado State Bars.


Vanderbilt V. ICOS And Proving Joint Inventorship

Law360, New York (June 23, 2010) -- On April 7, 2010, the U.S. Court of Appeals for the Federal Circuit in Vanderbilt Univ. v. ICOS Corp., 601 F.3d 1297 (Fed. Cir. 2010), clarified the legal standards for determining joint lnventorship when a patentee allegedly uses information from a third party as the basis to derive an invention. > Read More


Undergraduate Degree:

  • B.S. in Mechanical Engineering; University of Arizona

Graduate Degree:

  • M.S. in Mechanical Engineering; Stanford University

Law Degree:

  • George Washington University School of Law